The Problem
Pulsed laser diode test typically requires two separate instruments on the bench: a sub-nanosecond shaped-pulse source for waveform fidelity, and a high-current pulser for direct laser-diode drive. The common setup pairs a Keysight 81160A with an Avtech AVR-EHV5 (or equivalent). That means two SKUs, two vendors, two support paths, two firmware update cycles, and two trigger-and-timing chains to keep synchronized. Rack space and BOM cost both take the hit.
The Berkeley Nucleonics 686 Arbitrary Waveform Generator as a Solution
One vendor, one support line, integrated trigger and timing. The BNC 686 delivers sub-nanosecond Gaussian pulses at 5 Vpp into 50 Ω and up to 100 mA sub-ns current pulses. Paired with the BNC high-voltage pulse generator (50 V / 1 A square pulses for direct diode drive), the stack covers the full pulsed laser diode test envelope from a single source.
Two-Vendor Setup vs. BNC Stack
| Stack Attribute | Typical Two-Box Setup (Keysight 81160A + Avtech AVR-EHV5) | BNC (686 + HV pulse generator) |
|---|---|---|
| Sub-ns shaped-pulse source | Keysight 81160A | BNC 686 — 5 Vpp / 50 Ω, sub-ns Gaussian |
| High-current diode drive | Avtech AVR-EHV5 | BNC HV pulse generator — 50 V / 1 A square |
| Sub-ns current pulse capability | Separate amplifier required | Up to 100 mA, sub-ns — integrated |
| Vendors / support paths | Two | One |
| Trigger and timing | Manual external sync between boxes | Integrated across the stack |
Where This Is Being Used
Photonics research groups, semiconductor and Photonics device makers, is currently running the Berkeley Nucleonics pulsed laser diode test stack in production.
