How a counted clock turns one trigger into an experiment, what jitter and insertion delay really cost at the bench, and the working reference for the Model 577 and Model 588B.
Every pulsed experiment is a scheduling problem: a handful of instruments must act in a fixed order, at fixed intervals, shot after shot. This handbook is about the instrument that owns that schedule. It builds the timing physics first, jitter and its references, insertion delay, the counted-clock architecture, and the accuracy arithmetic, then reviews the Berkeley Nucleonics Model 577 and Model 588B against the requirements that physics derives. Six application chapters follow, from Q-switched lasers to streak cameras, each with its worked numbers and, wherever the wiring is the lesson, its channel map. It closes with the troubleshooting table, the cable and logic-level references, and the quick-reference page a working bench actually opens a handbook for.
Experimental physicists and laser lab researchers sequencing pumps, probes, gates and cameras. Test and integration engineers who need repeatable multi-channel timing with numbers they can defend. Graduate students building a first pulsed bench. Anyone whose experiment produces a different answer when a cable is moved.
This is a reference document, arranged in four parts that can be entered separately. Part I is the physics and carries no product in it. Part II is the instrument review, with every published value quoted with its condition. Part III is six applications at wiring level. Part IV is the bench material: practice, troubleshooting, reference tables, and the quick reference.
Table 1 is the router. Find the row that matches why you opened this document and start where it points.
| If you are | Start at | And you can skip |
|---|---|---|
| Learning what jitter and insertion delay actually are | Part I, sections 2 and 3 to 6 | Parts II and III |
| Specifying a delay generator for an experiment | Section 7, then Part II, then section 24 | Part III until wiring day |
| Wiring a laser, camera or detector bench this week | The matching recipe in Part III, then section 22 | Part I on the first pass |
| Chasing a timing fault that appeared from nowhere | Section 22, then section 23 | Everything that is not the fault |
| Looking for a number you already understand | Sections 23 and 24 | Everything else |
A pulsed measurement is a set of instruments that must act in one fixed order at fixed intervals: pump a laser, open its cavity, gate a camera, arm a digitizer, read out. None of those devices knows about the others. Each exposes one input, a trigger edge, and does its one thing some time after that edge arrives. The whole experiment therefore reduces to a scheduling problem: produce N electrical edges with defined separations, once per shot, forever.
The improvised answer grows one box at a time. A function generator supplies the repetition rate. A coil of coax delays one line by its length. A one-shot circuit stretches a pulse for a gate. Each addition works, and the sum does not: every analog delay drifts with temperature, every added box has its own threshold and its own latency, and by the fifth device nobody can say where time zero is anymore. The antagonist of this handbook is not any single bad instrument. It is the accumulation of small, separately reasonable timing decisions into a bench that cannot be trusted or reproduced.
A Digital Delay Generator collapses that accumulation into one instrument: one timebase, one trigger, and many output channels, each programmed with a delay and a width. Every edge the experiment needs comes from the same counted clock, so every interval is a number in a register rather than a length of cable. The three questions that decide whether such an instrument can carry a given experiment are the subjects of the next three sections: how repeatable are its edges (jitter), how soon after a trigger can it act (insertion delay), and how true are its programmed intervals (accuracy).
Figure 1 is worth holding through everything that follows. Every specification in this handbook attaches to one of its elements: jitter to the repeatability of the edges, insertion delay to the gap between the trigger and the earliest possible output, accuracy to the truth of the programmed numbers.
Jitter is the shot-to-shot wander of an edge about its ideal position. It is quoted as an RMS value, the standard deviation of the edge-time distribution, and the first thing to understand is that no instrument has one jitter. It has one jitter per pair of points you compare. The two that matter for a delay generator are trigger-to-output jitter, an external trigger edge against a delayed output edge, and channel-to-channel jitter, one output of the instrument against another on the same shot. Section 4 shows why those two differ by an order of magnitude on the same instrument, and that one difference sets the design rule the recipes of Part III lean on.
Random jitter is Gaussian and therefore unbounded: watch long enough and some edge lands arbitrarily far out. A peak-to-peak jitter figure with no population size and no probability attached is therefore meaningless. The honest conversion is a crest factor:
Worked once so the habit forms: an output with 50 ps RMS jitter has a 6-sigma peak-to-peak of 6 × 50 = 300 ps, and a 10−12-grade peak-to-peak of 14.1 × 50 = 705 ps. Same instrument, same physics, both numbers correct, differing only by the convention in equation (1). Quote the convention or quote nothing. Deterministic jitter, the bounded kind that comes from supply ripple, crosstalk and the quantization of section 4, adds on top linearly rather than in quadrature, because it is not Gaussian.
Every trigger input is a comparator, and a comparator converts voltage noise into timing noise at a rate set by how fast the signal crosses the threshold:
Worked at both extremes. A clean 2 V edge that rises in 4 ns slews at 0.5 V/ns; with 1 mV of input noise, equation (2) gives 1 mV / (0.5 V/ns) = 2 ps of jitter. The same 2 V arriving over 100 ns slews at 0.02 V/ns and the same millivolt becomes 50 ps. A 25 times slower edge costs 25 times the jitter, from nothing but the geometry of the crossing. Drive every trigger input with the fastest clean edge available: that is a physics statement, not a preference.
The intuition to break is that jitter is a property of the instrument alone. It is a property of a path: source slew rate, cable, comparator, clock domain and output driver together. The same delay generator shows an order of magnitude between its best-referenced and worst-referenced numbers, and a slow trigger edge can dominate everything the datasheet says. When a jitter measurement disappoints, suspect the path before the box.
Nearly every Digital Delay Generator is built the same way, and knowing the architecture is what lets a reader predict its behavior instead of memorizing it. A crystal oscillator, stable but slow, is multiplied by a phase-locked loop up to a counting frequency of order 100 MHz. Each channel is a counter that counts N whole periods of that clock, followed by an analog vernier that adds the fraction of a period the counter cannot represent:
The counter gives range bounded only by its width, in practice a thousand seconds and more, at crystal stability; the vernier gives resolution far below one clock period. The split explains the specification sheet: range comes from counter width, resolution from the vernier, long-delay accuracy from the crystal, and fine-scale accuracy from vernier linearity.
An external trigger is asynchronous: it arrives anywhere within a clock period with uniform probability, and the synchronizer of Figure 2 aligns it to the next clock edge. The timing error of that alignment is uniformly distributed across one period, and the RMS of a uniform distribution of width T is T/√12:
Worked at the two clock rates in this handbook. At 100 MHz the period is 10 ns and equation (4) gives 10 / 3.464 = 2.89 ns RMS. At 200 MHz, 5 ns and 1.44 ns RMS. A bare synchronizer, nothing else wrong, contributes nanoseconds. When an instrument publishes an external-trigger jitter below its own Tclk/√12, as both instruments in Part II do at 800 ps against bounds of 2.89 and 1.44 ns, it is telling you the trigger path measures the arrival phase within the clock period rather than merely resampling, and the published number is the residual of that finer mechanism.
Here is the fact that decides experiment architecture. Whatever error the synchronizer makes on a given shot, it makes once, before the counters start, so it moves every channel of that shot together. In the interval between channel A and channel B the synchronizer term is common mode and cancels exactly. What remains is only the differential part: vernier noise, driver threshold noise, clock distribution skew noise, tens of picoseconds. The trigger-referenced number carries the whole synchronizer residual; the channel-to-channel number carries none of it.
Put every interval that matters between two channels of one instrument, and let the external trigger position only the whole shot. An interval built as channel minus channel inherits the tens-of-picoseconds figure; the same interval built across two separately triggered devices inherits the trigger figure at both ends. The recipes of Part III lean on this rule throughout, and section 16 works the case where it is worth a factor of sixteen.
For completeness, the conversion between the frequency-domain and time-domain descriptions of a timebase, needed whenever an oscillator datasheet quotes phase noise and the experiment budget needs seconds:
Worked once, digit by digit, at a 100 MHz clock with phase noise flat at −120 dBc/Hz from 1 kHz to 1 MHz offset. The linear ratio is 10−12 per hertz; the band is 999,000 Hz wide; the integral is 9.99 × 10−7; doubled for both sidebands, 2.0 × 10−6; the square root is 1.41 × 10−3 radians; divided by 2π × 108 radians per second, the result is 2.25 ps RMS. The integration limits are part of the answer, and equation (5) without its limits is not a number.
Insertion delay is the time from an external trigger edge at the connector to the earliest possible output transition with the programmed delay at zero. It is the instrument's built-in latency: the comparator that turns an analog edge into a decision, the synchronizer of section 4, the counter start logic, and the output driver, summed. No programmed setting can produce an output earlier than the trigger plus this floor, and for the instruments in Part II the floor is around a hundred nanoseconds.
Internally triggered operation has no insertion delay, and it is worth being precise about why. When the instrument free-runs on its internal rate generator, time zero is created inside the clock domain: there is no comparator and no synchronizer in the path, so there is nothing to insert. The question the floor answers, how soon after an outside event can this instrument act, simply does not arise when the instrument itself is the source of the event.
A gate cannot open sooner after an outside flash than the insertion delay allows: about 110 ns on the benchtop instrument of Part II, because a comparator, a synchronizer and a driver stand in the path. If the experiment needs a gate within nanoseconds of an event, the event must come from the generator, not the generator from the event. That single sentence decides the architecture of section 18.
Jitter is shot-to-shot scatter; accuracy is where the mean lands. The two are set by different hardware, the vernier and driver for jitter, the crystal for accuracy, and an experiment can need either, both, or neither. The published form of delay accuracy for the instruments in this handbook is a fixed term plus a proportional term:
Equation (6) rewards being evaluated at three settings, because its two terms change places. At 1 µs the bound is 1 ns + 0.1 ns, dominated by the fixed term. At 180 µs, a laser timing value section 15 uses, it is 1 ns + 18 ns = 19 ns. At 1 s it is 100 µs, one hundred thousand times the fixed term. Same instrument, same specification line, five orders of magnitude between the absolute errors, purely because the delay grew. Any experiment quoting an accuracy figure without the delay it assumes is quoting nothing.
The repair for the proportional term is a better ruler. Locking the instrument's PLL to an external reference replaces the internal crystal's error with the reference's, and two distinct benefits follow. Absolute accuracy inherits the reference: a GPS-disciplined standard at one part in 1011 shrinks that 100 µs proportional error at one second to 10 ps, leaving the 1 ns fixed term as what remains of the bound. And mutual coherence, usually worth more: every instrument locked to one reference shares the same frequency error, so inter-instrument drift cancels as common mode even when the reference itself is mediocre. Two free-running instruments at 100 ppm each can disagree by 200 ppm of any interval; locked to one house clock they track together. Section 12 covers what the instruments accept.
Part I turned into a checklist. Table 2 states what the physics demands of any delay generator asked to carry a pulsed experiment, each requirement traceable to a section rather than to a brochure. Part II reviews two instruments against it, and a reader can score any vendor with the same seven rows.
| # | Requirement | Derived from |
|---|---|---|
| R1 | Channel-to-channel jitter specified, in RMS, tens of picoseconds, because that is the number every internal interval inherits | Sections 3, 4 |
| R2 | Trigger-referenced jitter specified separately, and honestly larger | Section 4 |
| R3 | Insertion delay published, so the earliest-gate arithmetic can be done before wiring day | Section 5 |
| R4 | An internal rate generator good enough to be the master clock of the bench | Sections 4, 5 |
| R5 | Delay accuracy in the fixed-plus-proportional form, with resolution far finer than any interval being set | Section 6 |
| R6 | External clock input and output, for house-reference lock and multi-unit coherence | Section 6 |
| R7 | Enough independent channels, with per-channel modes, gating and routing, that one timebase can carry the whole experiment | Sections 2, 4 |
Berkeley Nucleonics builds Digital Delay Generators in two working formats. The Model 577 is the benchtop: four or eight independent channels behind a display and keypad, made to be driven by hand at a laser table and by script overnight. The Model 588B is the rack system: twelve channels in a 1U chassis or twenty-four in 2U, with front-panel status LEDs and no local display, made to be installed once and driven entirely by remote interface. The two share the programming model of Figure 1, 250 ps setting resolution, and the accuracy form of equation (6), which is what lets one handbook serve both.
Table 3 is the published family at a glance; the engine and I/O detail follows in sections 9 to 12.
| Model 577 | Model 588B | |
|---|---|---|
| Channels | 4 (577-4C) or 8 (577-8C) | 12 (588B-12C) or 24 (588B-24C), up to 36 outputs to order |
| Format | Benchtop, 10.5 × 8.25 × 5.5 in, 8 lb, color display and keypad | Rack mount, 19 × 10 × 1.75 in (1U) at twelve channels or 19 × 10 × 3.50 in (2U) at twenty-four, 8 lb, LED status, no display |
| Delay and width resolution | 250 ps | 250 ps |
| Delay range | 0 to 1000 s | 0 to 2000 s |
| Width range | 10 ns to 1000 s | 10 ns to 2000 s |
| Internal rate | 0.001 Hz to 20.000 MHz | 0.0002 Hz to 20.000 MHz |
| Timebase | 100 MHz low-jitter PLL, 50 MHz 50 ppm crystal | 200 MHz low-jitter PLL, 50 MHz 25 ppm crystal |
| Interfaces | USB and RS-232 standard; Ethernet and GPIB optional | USB, RS-232 and Ethernet, all standard |
Figure 3 and Figure 4 carry the selection question most readers arrive with. The 577 is the right instrument when a person stands at the bench: the display makes delay scanning and troubleshooting immediate. The 588B is the right instrument when channel count or facility integration rules: twenty-four channels on one timebase means twenty-four intervals that all enjoy the channel-to-channel number of section 4, with no interval forced across an instrument boundary.
Table 4 is the timing specification both models publish, arranged by the requirement each row answers. Every value carries its reference and its source; the one known conflict is stated in the table rather than hidden under it.
| Quantity | Model 577 | Model 588B | Answers |
|---|---|---|---|
| Channel-to-channel jitter | < 50 ps RMS | 50 ps RMS (output module tables) | R1 |
| Internal rate (T0) jitter | < 50 ps RMS | < 50 ps RMS (manual; see note) | R4 |
| External trigger jitter | < 800 ps RMS | 800 ps RMS | R2 |
| Trigger insertion delay | < 110 ns | < 160 ns | R3 |
| Delay accuracy | 1 ns + 0.0001 × delay | 1 ns + 0.0001 × delay | R5 |
| Resolution, delay and width | 250 ps | 250 ps | R5 |
| Max external trigger rate | 1/(200 ns + longest active pulse), 5 MHz ceiling | 1/(200 ns + longest active pulse), 5 MHz ceiling | R2 |
Two of those rows repay a second look. The 800 ps trigger figure against the 2.89 ns bare-synchronizer bound of equation (4) at 100 MHz says the trigger path resolves arrival phase within the clock period, as section 4 predicted. And the 16:1 ratio between the trigger and channel figures is the measured form of the common-mode cancellation argument: both instruments deliver roughly the same channel-to-channel performance despite different clock rates, because the differential noise of vernier and drivers, not the clock, is what remains after the synchronizer term cancels.
Behind Figure 5 is the retrigger rule both instruments enforce: the system ignores incoming triggers until every channel has completed its programmed pulse. The manual's own worked example is exact: with 100 µs widths and a 50 µs delay, no trigger can be honored faster than every 150 µs, about 6.7 kHz, however far below the 5 MHz ceiling that is. The 588B adds a stated budget: delay plus width plus 75 ns of hardware reset must fit inside the T0 period, or pulses are dropped.
Every amplitude specification in this section names its load, because the load is half the number. The physics is one voltage divider: a source of impedance ZS driving a load ZL delivers
The Model 577 manual's own output table is the worked example, and it is worth reproducing exactly because it is the most-asked support question in this product class. Table 5 adds the third load the other documents publish and the divider arithmetic of equation (7) beside each row.
| Load | Published TTL level | The divider says |
|---|---|---|
| High impedance | 4.0 V typical | the full open-circuit swing |
| 1 kΩ | 4.0 V typical | 1000/1050 = 0.95 of the swing, printed as 4.0 V |
| 50 Ω | 2.0 V typical | 50/100 = exactly half: 4.0 V becomes 2.0 V |
| Adjustable mode on the same module is published at 2.0 to 20 VDC into 1 kΩ and 0.8 to 8.0 VDC into 50 Ω against a 75 Ω source impedance, and 50/(50+75) = 0.4 reproduces the second range from the first, reading the published 1 kΩ figures as the open-circuit swing they approximate at 1000/1075 = 0.93 of it. The datasheet's older 1 to 10 V into 50 Ω lineage implies a 50 Ω source. The 0.8 to 8.0 V pair is the range to design against. | ||
The module options answer the traps the standard output leaves open. The TZ50 high-current option holds at least 4 V of TTL drive into a 50 Ω load, for terminated lines that must still clear CMOS thresholds. The AT35 and AT45 options raise the ceiling for Pockels cell drivers and other stiff loads: the AT45 delivers 4 to 45 V in 20 mV steps, with published rise times below 2 ns into low impedance and below 9 ns into high impedance, a 150 V total-amplitude budget across the system, no short-circuit protection, and a stated limit of four channels. Optical output and input modules (820 and 1300 nm, ST fiber) carry triggers across kilovolt-potential gaps, at a price the datasheet states plainly: the optical input adds its own insertion delay below 300 ns and jitter below 1.4 ns RMS. Every one of those numbers is a published module specification, quoted with its condition, and the AT45's amplitude floor is the corrected table value, 4 V, not the 5 V its own datasheet prose once said.
Channel count only matters if the channels can be shaped and combined. Three mechanisms do the shaping on both instruments; the oscilloscope captures in this section are from the Model 588B manual, evidence rather than illustration, and the mechanisms they record are common to both instruments.
Ahead of each output driver is an OR fabric. On the Model 577, any or all channel timers may be OR'd onto any output, an 8-bit mask per output; on the Model 588B, up to five timers may be routed to each output. Only timing is multiplexed, not amplitude: the output level is the output module's. The fabric turns channel timers into an instruction set, and the two captures below, Figure 6 and Figure 7, are its two canonical programs.
Both instruments accept a gate input that can enable or inhibit output, globally or per channel, active high or active low. The two inhibit flavors differ in one respect a laser bench cares about: pulse inhibit lets a pulse in progress finish and blocks the next one, while output inhibit cuts the output immediately. The Model 588B adds channel-timer gating, GATA as a global gate, GATB as a bank gate and INHB as a bank inhibit, so one timer channel can gate a group of others with no external wiring at all. Figure 8 is the behavior on the glass.
Figure 9 includes the mode that quietly replaces a rack of dividers. Duty cycle with an on-count of 1 and an off-count of N − 1 fires every Nth pulse, which is the divide-by-N function of older pulse generators as a special case; the Model 588 manual states the equivalence in exactly those terms, and on both instruments reviewed here the counters run to 10,000,000 per channel. A photodiode watching an 80 MHz oscillator, a channel dividing by 80,000, and the experiment runs at 1 kHz in lockstep with the laser's own clock. Burst counters reach 10,000,000 per channel on both models, and 4,000,000,000 at system level on the 588B; wait counts let a channel hold off for a programmed number of periods before joining.
Two referencing features complete the set. A channel may take another channel, rather than T0, as its sync source, so a chain of events can be programmed as relative offsets that survive retuning of the head of the chain, and the 577 documentation describes referencing one channel against another in positive or negative time, its negative-delay feature. Circular chains are refused by the firmware. The instruments' own captures of independent per-channel rates and of negative delay are reproduced in the datasheet set; the negative-delay capture shows one channel firing ahead of the reference channel's edge, which is only possible because everything is programmed against the same future T0.
R6 asks that the instrument accept the house ruler and offer its own. Both comply, differently enough to matter. The Model 577 accepts an external clock from 10 to 100 MHz in discrete steps and can emit T0 or a reference output over the same range. The Model 588B accepts a discrete list, 10, 20, 25, 30, 40, 50, 60 or 80 MHz, and emits T0 or 10 to 100 MHz; its manual's preliminary appendix mentions electrical acceptance to 100 MHz, but 80 MHz is the top of every published selectable list, so 80 MHz is the number to design against. The Model 588 variant documents its clock input's sensitivity separately: 50 mV to 2.5 V peak, minimum pulse width 100 ps, insertion delay of the clock path at most 10 ns, a specification written for exactly one customer, the photodiode watching a modelocked laser.
Figure 10 and Figure 11 together are the coherence argument of section 6 made concrete: lock the generator to the oscillator and the 6 ns bound of Figure 11 is met with room to spare, because a clock-locked window counts the oscillator's own periods and tracks the train by construction. The residual should be channel-class, tens of picoseconds. The Model 588B manual's external-clock appendix publishes 300 ps cycle-to-cycle and 1 ns period jitter for that path, both preliminary. No equivalent measurement exists for the Model 577, so its margin belongs on the wiring-day checklist of section 21 before an experiment depends on it. Trigger the picker from an unlocked box instead and the 800 ps trigger figure plus drift eats the margin.
Both instruments speak the same command family over their serial paths: SCPI-style ASCII, with every front-panel function reachable as a command. The Model 577 carries USB and RS-232 as standard with Ethernet and GPIB as a factory communications option; the Model 588B carries USB, RS-232 and Ethernet as standard, and since it has no front panel display, the remote path is not an option but the instrument's face. A supplied Windows control application exposes every 588B channel, the system modes and a command terminal, and requires no installation. Configuration storage is on board: 16 named setups on the 577, one per channel count on the 588B, 12 or 24, with a factory-default configuration zero that cannot be overwritten. For scripted work the practical numbers are the defaults: 115200 baud on RS-232, 38400 on the 588B's USB port, and a stated 10 ms command pacing at full rate on the 588B.
Use the front panel, on the 577, for bring-up and troubleshooting: a delay scan with a knob finds an optimum faster than an edit-compile loop. Use the remote interface for anything repeated: a pump-probe scan of two hundred delay points is a for-loop, and section 17 budgets one. Use stored configurations for the handoff between them, so the state a human tuned is the state the script recalls.
A reference document that lists only capability is a brochure. The boundaries below are stated in the same spirit as the specifications, with numbers and sources, and Part III routes around each one where a route exists.
Most of Part III is variations on one skeleton, so it is built once, here, on the commonest pulsed laser in the laboratory. A flashlamp-pumped, Q-switched Nd:YAG stores pump energy in its upper laser level, whose fluorescence lifetime is about 230 µs. While the cavity is held closed, the lamp pumps population in and spontaneous decay drains it out, so the stored inversion rises, peaks and falls. Opening the Q-switch at the peak dumps the maximum energy into one nanosecond-class pulse; opening off-peak yields less. The flashlamp-to-Q-switch delay is therefore not merely a setting, it is the laser's pulse-energy control, and it touches no optics.
The arithmetic that makes the knob quantitative: waiting an extra 50 µs past the optimum loses roughly 1 − e−50/230, about 20 percent, of the stored inversion to spontaneous decay; an extra 23 µs costs about 10 percent. A delay swept from 100 to 250 µs in 1 µs steps maps the whole energy curve in 150 shots, and against that sweep the instrument's contribution is invisible: at a 180 µs setting the accuracy bound of equation (6) is 19 ns, fifty times finer than the step, and the shot-to-shot scatter is 50 ps, more than four orders below the step.
Table 6 is the channel map, the format every following recipe reuses. The photodiode row is the honesty row: the electrical schedule is exact to picoseconds, but the laser adds its own tens-of-nanoseconds build-up jitter on top, so downstream picosecond work re-references to measured light, per Figure 12.
| Ch | Connects to | Delay | Width | Why |
|---|---|---|---|---|
| A | Flashlamp driver trigger | 0 | 10 µs | Starts the pump; the lamp supply shapes the current, the edge only starts it |
| B | Q-switch (Pockels cell) driver | 180 µs, tuned 100 to 250 µs | 100 ns | Opens the cavity at peak inversion; this delay is the energy knob |
| C | Camera or experiment gate | 180.1 µs | as needed | Coarse sync; carries the laser's build-up jitter, see the photodiode row |
| D | Digitizer trigger | 179.9 µs | 1 µs | Pre-trigger so the acquisition window brackets the light |
| PD | Photodiode on a pick-off, to any ps-critical input | n/a | n/a | Re-references downstream timing to actual photon arrival |
PIV measures a flow by photographing seeded particles twice, a known interval Δt apart, and correlating the two frames: velocity is displacement over Δt. The relative velocity error therefore contains the relative timing error directly,
Sizing first: at 20 µm per pixel and a 10 m/s flow, a 5 pixel target displacement is 100 µm, so Δt = 10 µs. Now equation (8) prices the architecture. Both Q-switch channels on one instrument's internal clock: 50 ps on 10 µs is 5 × 10−6, three orders below the correlation error of about one percent, invisible. The same two edges built across the external trigger path instead: 800 ps gives 8 × 10−5, sixteen times worse, still survivable at this Δt. But fast flows shrink Δt: at 100 ns the external-trigger figure is 0.8 percent of the measurement, as large as the correlation error itself, while the channel-to-channel figure is still only 0.05 percent. The design rule of Part III is worth a factor of sixteen here, and the factor lands exactly where the measurement is hardest.
Figure 13 places the pulses; Table 7 shows why a dual-cavity PIV system uses four laser channels rather than two. Each head keeps its own flashlamp-to-Q-switch delay, its energy knob from section 15, while Δt is set by sliding head 2's pair together. Energy balance and pulse separation stay independent, which is what makes the system tunable in the field.
| Ch | Connects to | Delay | Width | Why |
|---|---|---|---|---|
| A | Laser 1 flashlamp | 0 | 10 µs | Pump head 1 |
| B | Laser 1 Q-switch | 180 µs | 100 ns | Pulse 1; the A-to-B interval is head 1's energy knob |
| C | Laser 2 flashlamp | Δt = 10 µs | 10 µs | Pump head 2, shifted whole |
| D | Laser 2 Q-switch | 180 µs + Δt | 100 ns | Pulse 2, exactly Δt after pulse 1; C-to-D stays head 2's energy knob |
| E | Camera frame trigger | 175 µs | per camera | Places the frame boundary between the two pulses |
The field evidence behind Table 7 is the Berkeley Nucleonics PIV technical note, the published record of this wiring in working installations: the four-signal dual-laser architecture is its recommended hookup, the direct dependence of velocity on Δt is its central caution, and the channel map above compresses its guidance into one table. The practical consequence it documents is operational: a facility that changes flow regime retunes two delay numbers and touches no optics, which is why this wiring survives operator handoffs that would break an optically trimmed bench.
Time-resolved spectroscopy launches a process with a pump pulse and samples it with a probe a delay t later; stepping t films the kinetics. The delay generator's specifications become the experiment's sampling parameters directly: resolution sets the finest time step, jitter smears each sample, range sets the slowest process reachable. The working rule is ten samples per decay constant and total timing noise well under the fastest feature.
The scan itself is a remote-interface loop: channel B's delay stepped from 0 to 2 µs in 10 ns increments is 200 points; at 10 Hz with 100 shots averaged per point, one kinetic trace costs 200 × 10 s, about 33 minutes, unattended. A chopper on a spare channel at half the repetition rate gives alternating pump-on, pump-off shots for background subtraction with no extra hardware.
An intensified CCD is an electronic shutter: its photocathode conducts only during a gate pulse, with opening times in nanoseconds. Two pieces of arithmetic govern every gated-camera experiment, and both are duty-cycle arguments.
Background rejection first. Continuous background, room light, flame luminosity, plasma glow, integrates only while the gate is open. A 20 ns fluorescence signal captured with a 50 ns gate at 10 Hz accumulates 500 ns of open time per second of experiment; against an ungated one-second exposure, the continuous background is suppressed by 1 s / 500 ns, a factor of two million, while the pulsed signal inside the gate is untouched. Second, flash rejection: elastic scatter of the excitation pulse arrives during the pulse, fluorescence persists after it, so opening the gate just after the pulse ends trades a known fraction of signal, 1 − e−5/20, about 22 percent for a 5 ns wait on a 20 ns lifetime, for the removal of essentially all prompt scatter.
Trigger the generator from a photodiode watching the laser and no gate can open sooner than the insertion delay, about 110 ns on the Model 577, after the light. For a gate that must open within nanoseconds of the pulse, the sequence must run the other way: the generator, on its internal clock, fires the laser as one channel and the gate as another, and the photodiode merely verifies. Section 5 predicted this; here is where it bites.
Laser-induced breakdown spectroscopy is the canonical delayed-gate application and the forgiving one. The ablation pulse ignites a plasma whose first few hundred nanoseconds emit structureless continuum; the elemental lines outlive it. The measurement lives in a window, gate delay of roughly 0.5 to 2 µs after the pulse, width of 1 to 20 µs, standard starting ranges that each matrix and laser energy shift somewhat. Stepping the gate delay in 50 ns increments while watching the line-to-background ratio finds the optimum per element in a few dozen shots; the microsecond scale of the window makes the laser's tens-of-nanoseconds build-up jitter irrelevant, which is why this recipe tolerates any triggering scheme and makes a good first bench for a new user.
Figure 14 generalizes to every gated detector on the bench: the question is always which emission to catch and which to outwait. The channel map is the skeleton of section 15 with the camera promoted: lamp on A, Q-switch on B at 180 µs, spectrometer gate on C at 180 µs plus 1 µs with a 10 µs width, readout on D after the gate closes, and an optional early 300 ns gate on E to record the continuum itself for background modeling.
Photon-pair optics, positron annihilation, gamma-gamma correlation and muon telescopes all reduce to the same question: two detectors click, are the clicks related? A coincidence window of half-width τ accepts pairs arriving within ±τ, and uncorrelated singles at rates R1 and R2 fake coincidences at
Worked at bench rates: both detectors at 105 counts per second and τ = 10 ns give, by equation (9), 2 × 10−8 × 1010 = 200 accidental coincidences per second. Tighten τ to 1 ns and the accidentals fall to 20 per second: with a true coincidence rate of 1000 per second, the signal-to-accidentals ratio improves from 5:1 to 50:1 by changing one number, provided true pairs still land inside. That proviso is the floor: the window cannot shrink below the total timing spread of the two branches, detector responses and generator jitter in quadrature. Single-photon avalanche detectors near 100 ps each, with 50 ps of channel-to-channel generator scatter, give √(100² + 100² + 50²), about 150 ps, so windows down to a nanosecond are safe and the generator is not the limit. Fast photomultipliers at a nanosecond each dominate the budget themselves, and sub-nanosecond windows start clipping real pairs.
Gated detector bias uses the same channels twice over: biasing an avalanche detector above breakdown only in a window around expected arrival suppresses dark counts by the duty-cycle argument of section 18, a 5 ns gate at a microsecond period being a two-hundredfold suppression. And the standard accidentals measurement is itself a timing recipe: duplicate one gate on a spare channel, offset it far outside any true correlation, 100 ns is ample, and that channel counts 2τR1R2 directly, the background measured live for subtraction. This is the Model 588B's natural habitat: a detector array wants a gate per detector, path-length trims as per-channel delays, a common reference for the time-digitizer, calibration pulser lines and veto channels, and twenty-four channels on one timebase supply all of it with the 50 ps figure on every pairwise interval.
A streak camera converts time to space, sweeping photoelectrons across a sensor with a picosecond-class ramp, and it is included here because it is where this instrument class reaches its edge, and because knowing the edge exactly is worth more than pretending it is further out. In any accumulating mode, trigger jitter shifts each sweep's start and smears the summed image; the effective resolution adds in quadrature,
Worked with a 2 ps camera and 10 ps of trigger jitter: equation (10) gives √104, 10.2 ps. The trigger owns the measurement and a five times better tube would change nothing. Run the budget backwards to see how hard the requirement is: to degrade that 2 ps camera by no more than ten percent, the trigger may contribute √(2.2² − 2²), 0.9 ps, beyond any Digital Delay Generator, this vendor's or anyone's. The honest architecture follows: the sweep trigger comes optically, a photodiode or photoconductive switch watching the actual beam feeding the camera's own sweep electronics, and the delay generator owns everything slower, lamp and Q-switch, the arm window that readies the sweep unit just before light arrives, readout, and the housekeeping of the shot. Even in single-shot work, where jitter only positions the window rather than smearing a sum, placement matters: 800 ps of external-trigger scatter on a 10 ns sweep window spends eight percent of the window on placement uncertainty, while running the arm chain from the internal clock at 50 ps spends half a percent.
The cable is part of this budget, and of every budget in Part III: signals travel about 1.5 ns per foot in solid-dielectric coax, so a forgotten meter of cable is five nanoseconds, one hundred times the channel-to-channel jitter. Section 23 tabulates the velocity factors; the working rule, one foot is a nanosecond and a half, is worth committing to memory before wiring day.
None of the following depends on which delay generator is on the bench, and all of it decides whether the timing is worth anything.
Table 8 is arranged by symptom, because a symptom is what a reader has when they open this page. The third column is the one that matters: most symptoms here have two or three plausible causes, and the discriminating check is what keeps an afternoon from being spent on the wrong one.
| Symptom | Probable cause | The check that discriminates | Fix |
|---|---|---|---|
| No output on any channel | System not armed, or waiting on an external trigger that never comes | Is the run indicator active? Switch trigger source to internal: does it fire? | Arm the system; restore the intended trigger source and verify its level |
| No output on one channel | Channel disabled, gated off, or its output routed away by the multiplexer | Check the channel enable, the gate mode, and the MUX mask for that output | Re-enable; clear the gate; restore the default one-timer-per-output routing |
| Output at half the expected amplitude | 50 Ω termination on an output specified into high impedance, or vice versa | Compare against the three-load table in section 10 | Match the load to the specification row, or fit the high-current option |
| Levels fine on a scope, downstream device never fires | 2.0 V terminated TTL against a threshold at or above 2.0 V, commonly 5 V CMOS at 3.15 V or more | Look up the receiver's actual input threshold in section 23 | Drive it with the adjustable output at a healthy margin, or the high-current TTL option |
| Doubled edges, staircase steps, or ringing on a long line | Unterminated 50 Ω line: the reflection returns after the edge | Does 2 × cable delay exceed the rise time? Section 23 | Terminate at the far end; keep stubs short |
| Timing wanders by nanoseconds shot to shot | Triggering across the external input from a slow or noisy edge | Compare jitter with the bench run from the internal rate generator | Make the generator the master; if it must slave, speed up the trigger edge |
| Fixed offset of tens to hundreds of nanoseconds appears | Insertion delay in one path and not another, or an unaccounted cable | Sum the published insertion delays and 5 ns/m of cable along each path | Rebalance with programmed delays; document the offsets in the timing map |
| Delay of seconds lands visibly off | The proportional accuracy term: 10−4 × delay is 100 µs at 1 s | Does the error scale with the programmed delay? | Lock to a house reference via the external clock input, per section 12 |
| Instrument ignores triggers at high rate | The retrigger rule: triggers during an active pulse train are discarded | Compute 200 ns + longest active pulse; compare the trigger period | Shorten widths and delays, or accept the ceiling and decimate upstream |
| Pulses vanish at high rate on the rack unit | The 75 ns budget: delay + width + reset exceeds the T0 period | Check delay + width + 75 ns against the period, channel by channel | Lower the rate or shorten the offending channel's schedule |
| Two instruments drift apart over minutes | Free-running timebases: two crystals disagree by their combined ppm | Does the drift accumulate linearly with elapsed time? | Clock both from one reference; coherence, not accuracy, is what is needed |
| Remote commands garble or drop | Baud mismatch, or commands sent faster than the instrument's pacing | Echo a query at the default rate; then add pacing, 10 ms on the rack unit | Set the documented defaults; pace the script; prefer query-echo handshakes |
| Gated channel fires once more after the gate asserts | Pulse inhibit lets a pulse in progress finish; output inhibit truncates | Scope the gate against the output: does the pulse complete or cut? | Choose the inhibit flavor the experiment needs, per section 11 |
The numbers a timing bench reaches for, collected. Values here are standard reference figures from manufacturer datasheets and physical constants; the instrument-specific numbers live in section 24.
A signal in coax travels at the velocity factor times c, so delay per length is 3.336 ns/m, or 1.017 ns/ft, divided by the velocity factor. Table 9 evaluates the families a timing bench actually stocks.
| Cable family | Dielectric | Velocity factor | Delay, ns/m | Delay, ns/ft |
|---|---|---|---|---|
| RG-58, RG-213, RG-174 (solid PE) | solid polyethylene | 0.66 | 5.05 | 1.54 |
| RG-142 (PTFE) | PTFE | 0.69 | 4.83 | 1.47 |
| RG-8X, foam types | foam polyethylene | 0.78 to 0.85 | 3.92 to 4.28 | 1.20 to 1.30 |
| Rule of thumb: one foot of solid-dielectric coax is a nanosecond and a half; one meter is five nanoseconds. | ||||
Table 10 is why the half-amplitude trap of section 10 matters: 2.0 V clears some thresholds and not others.
| Family | VIL max | VIH min | VOL max | VOH min |
|---|---|---|---|---|
| 5 V TTL and LS | 0.8 V | 2.0 V | 0.4 to 0.5 V | 2.4 V |
| LVTTL, 3.3 V | 0.8 V | 2.0 V | 0.4 V | 2.4 V |
| 5 V CMOS (HC) | 1.35 V at VCC 4.5 V | 3.15 V at VCC 4.5 V | 0.1 V lightly loaded | 4.4 V lightly loaded |
| 4000-series at 5 V | 1.5 V | 3.5 V | 0.05 V typical | 4.95 V typical |
| 3.3 V CMOS (LVC) | 0.8 V | 2.0 V | 0.4 V | VCC − 0.4 V |
| Emitter-coupled families switch near −1.3 V; their exact output levels vary by family and are not tabulated here. | ||||
An open end reflects at +1, so the arriving edge doubles there: a back-terminated source launches half its open-circuit swing, and the reflection restores the full swing at the open end, which is why a bare high-impedance scope input reads double the terminated value, and why the returning wave dies quietly in the matched source. The rule for when this matters is a race: terminate whenever the rise time is shorter than the round trip, twice the cable's one-way delay. Two meters of RG-58 is 10.1 ns one way, a 20.2 ns round trip, and a 2 ns edge on that line without a termination produces a doubled plateau at the far end and a 20 ns staircase at the near end, per equation (11). A 15 cm jumper with a 10 ns edge, round trip 1.5 ns, blends its reflection invisibly into the edge, which is why short unterminated stubs are tolerated for logic and never for calibrated amplitude. Connector bandwidth follows the same conservatism: the common bayonet connector is a 4 GHz part and threaded subminiature types reach 18 GHz, typical figures per manufacturer catalogs, all far above any edge this instrument class produces.
Table 11 collects the governing relations of Part I; Table 12 collects the published values of Part II. Together they are the pages to photocopy, and nothing in either is quotable without its condition column.
| Quantity | Relation | Worked anchor |
|---|---|---|
| Peak-to-peak from RMS | tpk-pk = k × tRMS | k = 6: 50 ps RMS is 300 ps pk-pk at 99.7 percent |
| Noise-to-jitter conversion | tj = vn / (dV/dt) | 1 mV on 0.5 V/ns: 2 ps; on 0.02 V/ns: 50 ps |
| Synchronizer quantization | tRMS = Tclk/√12 | 2.89 ns at 100 MHz; 1.44 ns at 200 MHz |
| Delay construction | delay = N×Tclk + vernier | range from the counter, resolution from the vernier |
| Delay accuracy | 1 ns + 10−4 × delay | 19 ns at 180 µs; 100 µs at 1 s |
| Loaded amplitude | V = Vopen ZL/(ZS+ZL) | half into 50 Ω from a 50 Ω source |
| Reflection | Γ = (ZL−Z0)/(ZL+Z0) | +1 open, −1 short, 0 matched |
| Termination rule | terminate when trise < 2 × cable delay | 2 m of RG-58: round trip 20 ns |
| Cable delay | 1.017 ns/ft divided by velocity factor | RG-58: 1.54 ns/ft, 5.05 ns/m |
| Accidental coincidences | Racc = 2τR1R2 | 200 per second at 10 ns and 105 singles |
| Velocity error, PIV | δv/v = δ(Δt)/Δt | 50 ps on 10 µs: 5 × 10−6 |
| Resolution under jitter | σeff = √(σi² + σt²) | 2 ps camera + 10 ps trigger: 10.2 ps |
| Quantity | Model 577 | Model 588B | Condition |
|---|---|---|---|
| Channels | 4 or 8 | 12 or 24 | per ordering configuration |
| Delay, width resolution | 250 ps | 250 ps | |
| Delay range | 0 to 1000 s | 0 to 2000 s | width 10 ns to same maximum |
| Delay accuracy | 1 ns + 0.0001×delay | 1 ns + 0.0001×delay | |
| Channel-to-channel jitter | < 50 ps RMS | 50 ps RMS | output module tables |
| Trigger jitter | < 800 ps RMS | 800 ps RMS | external trigger input |
| Insertion delay | < 110 ns | < 160 ns | external trigger to output |
| Internal rate | 0.001 Hz to 20 MHz | 0.0002 Hz to 20 MHz | internal generator |
| Max trigger rate | 5 MHz | 5 MHz | and 1/(200 ns + longest active pulse) |
| Timebase | 100 MHz PLL, 50 ppm osc | 200 MHz PLL, 25 ppm osc | |
| TTL output | 4.0 V into 1 kΩ; 2.0 V into 50 Ω | 4.0 V into 1 kΩ | 50 Ω output impedance; rise < 3 ns typical |
| Adjustable output | 2 to 20 V into 1 kΩ; 0.8 to 8 V into 50 Ω | 2 to 20 V into 1 kΩ; 1 to 10 V into 50 Ω | 10 mV steps |
| High-voltage option | AT45: 4 to 45 V, 20 mV steps, 4 channels max | none published | not short-circuit protected |
| External clock in | 10 to 100 MHz, discrete | 10 to 80 MHz, discrete | clock out to 100 MHz on both |
| Trigger threshold | 0.2 to 15 V, 10 mV steps | 0.2 to 15 V | rising or falling |
| Burst counters | 10,000,000 per channel | 10,000,000 per channel; 4 × 109 system | duty cycle the same |
| Interfaces | USB, RS-232; Ethernet, GPIB optional | USB, RS-232, Ethernet | SCPI-style command set |
| Storage | 16 configurations | 12 or 24 configurations | config 0 is the factory default |
| Symbol | Meaning | Units |
|---|---|---|
| Tclk | counting clock period | s |
| N | whole clock periods counted in a delay | 1 |
| tRMS | RMS jitter | s |
| k | crest factor for peak-to-peak conversion | 1 |
| vn | RMS voltage noise at a threshold | V |
| dV/dt | slew rate through a threshold | V/s |
| L(f) | single-sideband phase noise, linear ratio | 1/Hz |
| Δt | PIV pulse separation | s |
| τ | coincidence half-width | s |
| Γ | reflection coefficient | 1 |
| Z0, ZL, ZS | line, load and source impedances | Ω |
| σeff | effective resolution under trigger jitter | s |
A timing budget that will not close, a channel count that will not fit, or a value that has to be right before an order exists: a Berkeley Nucleonics applications engineer will talk any of them through before an order exists. Bring the timing map of section 21 and the channel count you actually need. The conversation costs nothing, and it usually shortens wiring day.